Please use this identifier to cite or link to this item: http://hdl.handle.net/10071/35830
Author(s): Bianchi, I. S.
Serrano, J.
Pereira, R.
Date: 2024
Title: An overlapless maturity model for configuration management
Journal title: Journal of Economic Research and Business Administration
Volume: 149
Number: 3
Pages: 3 - 22
Reference: Bianchi, I. S., Serrano, J., & Pereira, R. (2024). An overlapless maturity model for configuration management. Journal of Economic Research and Business Administration, 149(3), 3–22. https://doi.org/10.26577/be.2024-149-i3-01
ISSN: 1563-0358
DOI (Digital Object Identifier): 10.26577/be.2024-149-i3-01
Keywords: Configuration management process
Maturity models
IT services providers
Design science research
Abstract: IT departments often encounter challenges due to overlapping practices from various frameworks, leading to unnecessary costs and inefficiencies. Additionally, Configuration Management (CM) processes are frequently implemented poorly, missing out on potential benefits. To address these issues, our research employs a Systematic Literature Review and Design Science Research methodology to develop a comprehensive and non-redundant CM Maturity Model. By integrating frameworks such as COBIT, ITIL, and CMMI-SVC, our model is designed to assist organizations lacking clear improvement strategies, those with inadequately implemented CM processes, or those seeking self-assessment. The model is also beneficial for companies managing multiple standards simultaneously. Managers can utilize this model to evaluate CM maturity before implementing various frameworks. Furthermore, we introduce the concept of "Quick Wins" to accelerate improvement initiatives. This research provides a practical tool for IT professionals to streamline CM processes and navigate the complex landscape of IT frameworks, ultimately leading to more efficient and effective CM practices.
Peerreviewed: yes
Access type: Open Access
Appears in Collections:IT-RI - Artigos em revistas científicas internacionais com arbitragem científica

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