Utilize este identificador para referenciar este registo: http://hdl.handle.net/10071/29280
Autoria: Maltusch, P.
Cardoso, E.
Kjærem, V.
Langfeldt, O. I.
Kibsgaard, G. J.
Editor: Desnos, J.-F., and López Nores, M.
Data: 2023
Título próprio: Using enterprise architecture for modeling and visualizing the impact of change: A report from the trenches
Volume: 95
Título e volume do livro: Proceedings of European University Information Systems Congress 2023. EPiC Series in Computing
Paginação: 140 - 150
Título do evento: European University Information Systems Congress 2023
Referência bibliográfica: Maltusch, P., Cardoso, E., Kjærem, V., Langfeldt, O. I., & Kibsgaard, G. J. (2023). Using enterprise architecture for modeling and visualizing the impact of change: A report from the trenches. In J.-F. Desnos, & M. López Nores (Eds.), Proceedings of European University Information Systems Congress 2023. EPiC Series in Computing (vol. 95, pp. 140-150). EasyChair. https://doi.org/10.29007/7q9z
ISSN: 2398-7340
DOI (Digital Object Identifier): 10.29007/7q9z
Palavras-chave: Enterprise architecture
Enterprise metamodel
Higher education
Impact of change
Modeling
Organizational capabilities
Resumo: Digital transformation has put Enterprise Architecture (EA) higher up on the agenda. The demands of digital transformation have intensified the need for organizations to have a common framework and vocabulary for understanding their structure and the interrelationship between key organizational components. This paper reports on the work developed by a multidisciplinary team from different European Higher Education Institutions (HEIs) to design a program that other HEIs can use to raise awareness of the importance of EA modeling in their organizations to display the impact of changes. The paper describes the program’s goals, the underlying methodology applied, and the insights gathered from two workshops realized in 2022 at the Norwegian University of Science and Technology (NTNU), in Norway, to validate the program’s methodology.
Arbitragem científica: yes
Acesso: Acesso Aberto
Aparece nas coleções:CIES-CRI - Comunicações a conferências internacionais

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